TLP3475W, new generation photorelay for semiconductor tester

What differentiates the TLP3475W is its ability to reduce insertion loss and improve high-frequency signal transfer characteristics, making it suitable for applications requiring fast signals and high accuracy such as semiconductor testers. 

Benefits: 

• Low insertion loss, avoiding power loss in high-frequency signals. 
• Stable operation at high frequencies up to 20 GHz. 
• Compact size: only 1.45 mm x 2.0 mm x 0.8 mm. 

Features: 

• Dimensions: 1.45 mm x 2.0 mm x 0.8 mm. 
• Operating temperature: -40 – 110 oC 
• Impedance: 1.1 – 1.5 (Ω) 
• Insertion loss: -3dB 

Applications: 

• Semiconductor testers  
• Measuring equipment  

Learn more: Toshiba Launches Small Photorelay Suitable for High-Frequency Signal Switches in Semiconductor Testers

Contact EPI Vietnam Technologies – the authorized distributor of TOSHIBA in Vietnam for technical support and samples. 

#Toshiba 

#photorelay 

#Semiconductor_testers 

#Measuring_equipment