TLP3475W, new generation photorelay for semiconductor tester

Toshiba has just launched a new photorelay product line, “TLP3475W”, designed for high-frequency signal switches in semiconductor testers.

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What differentiates the TLP3475W is its ability to reduce insertion loss and improve high-frequency signal transfer characteristics, making it suitable for applications requiring fast signals and high accuracy such as semiconductor testers. 


  • Low insertion loss, avoiding power loss in high-frequency signals. 
  • Stable operation at high frequencies up to 20 GHz. 
  • Compact size: only 1.45 mm x 2.0 mm x 0.8 mm. 


  • Dimensions: 1.45 mm x 2.0 mm x 0.8 mm. 
  • Operating temperature: -40 – 110 oC 
  • Impedance: 1.1 – 1.5 (Ω) 
  • Insertion loss: -3dB 


  • Semiconductor testers  
  • Measuring equipment  

Learn more: Toshiba Launches Small Photorelay Suitable for High-Frequency Signal Switches in Semiconductor Testers

Contact EPI Vietnam Technologies – the authorized distributor of TOSHIBA in Vietnam for technical support and samples.